Micro-photoluminescence spectroscopy on metal precipitates in silicon

Paul Gundel, Martin C. Schubert, Wolfram Kwapil, Jonas Schoen, Manfred Reiche, Hele Savin, Marko Yli-Koski, Juan Angel Sans, Gema Martinez-Criado, Winfried Seifert, Wilhelm Warta, Eicke R. Weber

    Research output: Contribution to journalArticleScientificpeer-review

    46 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)230-232
    JournalPHYSICA STATUS SOLIDI: RAPID RESEARCH LETTERS
    Volume3
    Issue number7-8
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Bonded wafers
    • Copper precipitate
    • Defect luminescence
    • Metal precipitates
    • Metallic impurity
    • Microphotoluminescence spectroscopy
    • Minority carrier
    • Multi-crystalline silicon solar cells
    • Silicon devices
    • Specific effects
    • X ray fluorescence spectroscopy

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