Metrology for industrial quantum communications: the MIQC project

Maria L. Rastello; Ivo P. Degiovanni; Alistar G. Sinclair; Stefan Kück; Christopher J. Chunnilall; Geiland Porrovecchio; Marek Smid; Farshid Manoocheri; Erkki Ikonen; Toomas Kubarsepp; D. Stucki; K.S. Hong; S.K. Kim; A. Tosi; G. Brida; A. Meda; F. Piacentini; P. Traina; A.Al. Natsheh; Jessica Y. Cheung; Ingmar Müller; R. Klein; Aigar Vaigu

Metrology for industrial quantum communications: the MIQC project

Maria L. Rastello, Ivo P. Degiovanni, Alistar G. Sinclair, Stefan Kück, Christopher J. Chunnilall, Geiland Porrovecchio, Marek Smid, Farshid Manoocheri, Erkki Ikonen, Toomas Kubarsepp, D. Stucki, K.S. Hong, S.K. Kim, A. Tosi, G. Brida, A. Meda, F. Piacentini, P. Traina, A.Al. Natsheh, Jessica Y. CheungIngmar Müller, R. Klein, Aigar Vaigu

Metrology Research Institute

Research output: Contribution to journal › Article › Scientific › peer-review

11 Citations (Scopus)

Original language	English
Pages (from-to)	S267-S275
Journal	Metrologia
Volume	51
Issue number	6
Publication status	Published - 2014
MoE publication type	A1 Journal article-refereed

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Rastello, M. L., Degiovanni, I. P., Sinclair, A. G., Kück, S., Chunnilall, C. J., Porrovecchio, G., Smid, M., Manoocheri, F., Ikonen, E., Kubarsepp, T., Stucki, D., Hong, K. S., Kim, S. K., Tosi, A., Brida, G., Meda, A., Piacentini, F., Traina, P., Natsheh, A. A., ... Vaigu, A. (2014). Metrology for industrial quantum communications: the MIQC project. Metrologia, 51(6), S267-S275.

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title = "Metrology for industrial quantum communications: the MIQC project",

author = "Rastello, {Maria L.} and Degiovanni, {Ivo P.} and Sinclair, {Alistar G.} and Stefan K{\"u}ck and Chunnilall, {Christopher J.} and Geiland Porrovecchio and Marek Smid and Farshid Manoocheri and Erkki Ikonen and Toomas Kubarsepp and D. Stucki and K.S. Hong and S.K. Kim and A. Tosi and G. Brida and A. Meda and F. Piacentini and P. Traina and A.Al. Natsheh and Cheung, {Jessica Y.} and Ingmar M{\"u}ller and R. Klein and Aigar Vaigu",

year = "2014",

language = "English",

volume = "51",

pages = "S267--S275",

journal = "Metrologia",

issn = "0026-1394",

publisher = "Institute of Physics Publishing ",

number = "6",

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Rastello, ML, Degiovanni, IP, Sinclair, AG, Kück, S, Chunnilall, CJ, Porrovecchio, G, Smid, M, Manoocheri, F , Ikonen, E, Kubarsepp, T, Stucki, D, Hong, KS, Kim, SK, Tosi, A, Brida, G, Meda, A, Piacentini, F, Traina, P, Natsheh, AA, Cheung, JY, Müller, I, Klein, R & Vaigu, A 2014, 'Metrology for industrial quantum communications: the MIQC project', Metrologia, vol. 51, no. 6, pp. S267-S275.

TY - JOUR

T1 - Metrology for industrial quantum communications: the MIQC project

AU - Rastello, Maria L.

AU - Degiovanni, Ivo P.

AU - Sinclair, Alistar G.

AU - Kück, Stefan

AU - Chunnilall, Christopher J.

AU - Porrovecchio, Geiland

AU - Smid, Marek

AU - Manoocheri, Farshid

AU - Ikonen, Erkki

AU - Kubarsepp, Toomas

AU - Stucki, D.

AU - Hong, K.S.

AU - Kim, S.K.

AU - Tosi, A.

AU - Brida, G.

AU - Meda, A.

AU - Piacentini, F.

AU - Traina, P.

AU - Natsheh, A.Al.

AU - Cheung, Jessica Y.

AU - Müller, Ingmar

AU - Klein, R.

AU - Vaigu, Aigar

PY - 2014

Y1 - 2014

UR - http://iopscience.iop.org/0026-1394/51/6/S267

M3 - Article

SN - 0026-1394

VL - 51

SP - S267-S275

JO - Metrologia

JF - Metrologia

IS - 6

ER -

Metrology for industrial quantum communications: the MIQC project

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