Abstract
Devices that form an optical image with a subwave-length resolution in real time - metalenses - are considered. Such devices either operate with near optical fields or convert near fields into wave fields. As a result, the spatial resolution of these devices is not limited by the diffraction limit. At the same time, the image is formed at a considerable distance from the object, which distinguishes near-field metalenses from the in-struments used in near-field probe microscopy. Metalenses are implemented based on metamaterials or their two-dimensional analogs, metasurfaces. Historically, this line of research was based on the so-called perfect lens, the concept of which did not withstand experimental verification but gave impetus to the development of real metalenses. Depending on the device and principle of operation, metalenses are called either superlenses or hyperlenses.
Original language | English |
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Pages (from-to) | 355-378 |
Number of pages | 25 |
Journal | Physics-Uspekhi |
Volume | 65 |
Issue number | 4 |
DOIs | |
Publication status | Published - Apr 2022 |
MoE publication type | A2 Review article, Literature review, Systematic review |
Keywords
- diffraction limit
- subwavelength resolution
- near field
- materials with a negative refractive index
- plasmon
- ENHANCED RAMAN-SPECTROSCOPY
- NEGATIVE REFRACTION
- DIFFRACTION-LIMIT
- OPTICAL HYPERLENS
- DIPOLE RADIATION
- FLAT LENS
- FIELD
- SUPERRESOLUTION
- MICROSCOPY
- TIME