Metalenses for subwavelength imaging

K. Baryshnikova*, S. S. Kharintsev, P. A. Belov, N. A. Ustimenko, S. A. Tretyakov, C. R. Simovski

*Corresponding author for this work

Research output: Contribution to journalReview Articlepeer-review

8 Citations (Scopus)

Abstract

Devices that form an optical image with a subwave-length resolution in real time - metalenses - are considered. Such devices either operate with near optical fields or convert near fields into wave fields. As a result, the spatial resolution of these devices is not limited by the diffraction limit. At the same time, the image is formed at a considerable distance from the object, which distinguishes near-field metalenses from the in-struments used in near-field probe microscopy. Metalenses are implemented based on metamaterials or their two-dimensional analogs, metasurfaces. Historically, this line of research was based on the so-called perfect lens, the concept of which did not withstand experimental verification but gave impetus to the development of real metalenses. Depending on the device and principle of operation, metalenses are called either superlenses or hyperlenses.

Original languageEnglish
Pages (from-to)355-378
Number of pages25
JournalPhysics-Uspekhi
Volume65
Issue number4
DOIs
Publication statusPublished - Apr 2022
MoE publication typeA2 Review article, Literature review, Systematic review

Keywords

  • diffraction limit
  • subwavelength resolution
  • near field
  • materials with a negative refractive index
  • plasmon
  • ENHANCED RAMAN-SPECTROSCOPY
  • NEGATIVE REFRACTION
  • DIFFRACTION-LIMIT
  • OPTICAL HYPERLENS
  • DIPOLE RADIATION
  • FLAT LENS
  • FIELD
  • SUPERRESOLUTION
  • MICROSCOPY
  • TIME

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