Mechanisms of Stress and Electromigration Induced Damage in Passivated Narrow Metallizations on Rigid Substrates

M.A. Korhonen, P. Borgesen, C.-Y. Li

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    JournalMaterials Research Bulletin
    Volume17
    Publication statusPublished - 1992
    MoE publication typeA1 Journal article-refereed

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