Mechanism of diffusion and dissociation of E-center in silicon

M. Ganchenkova, V. Borodin, R.M. Nieminen

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)1129
JournalDefect and Diffusion Forum
Volume237-240
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

Cite this