Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

Shigeki Kawai; Filippo F. Canova; Thilo Glatzel; Teemu Hynninen; Ernst Meyer; Adam S. Foster

doi:10.1103/PhysRevLett.109.146101

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

Shigeki Kawai
, Filippo F. Canova
, Thilo Glatzel
, Teemu Hynninen
, Ernst Meyer
, Adam S. Foster

University of Basel
Tampere University of Technology

Research output: Contribution to journal › Article › Scientific › peer-review

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Abstract

We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.

Original language	English
Article number	146101
Pages (from-to)	1-5
Number of pages	5
Journal	Physical Review Letters
Volume	109
Issue number	14
DOIs	https://doi.org/10.1103/PhysRevLett.109.146101
Publication status	Published - 2012
MoE publication type	A1 Journal article-refereed

Keywords

AFM
KPFM
NaCl

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10.1103/PhysRevLett.109.146101

PhysRevLett.109.146101Final published version, 379 KB

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title = "Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions",

abstract = "We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.",

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AU - Meyer, Ernst

AU - Foster, Adam S.

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AB - We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.

KW - AFM, KPFM, NaCl

KW - AFM

KW - KPFM

KW - NaCl

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Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

Abstract

Keywords

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