Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

Shigeki Kawai, Filippo F. Canova, Thilo Glatzel, Teemu Hynninen, Ernst Meyer, Adam S. Foster

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)
197 Downloads (Pure)

Abstract

We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.
Original languageEnglish
Article number146101
Pages (from-to)1-5
Number of pages5
JournalPhysical Review Letters
Volume109
Issue number14
DOIs
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed

Keywords

  • AFM
  • KPFM
  • NaCl

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