Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus

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Details

Original languageEnglish
Article number012006
JournalIOP Conference Series: Materials Science and Engineering
Volume443
Issue number1
Publication statusPublished - 14 Nov 2018
MoE publication typeA4 Article in a conference publication
EventInternational Conference on Scanning Probe Microscopy - Ekaterinburg, Russian Federation
Duration: 26 Aug 201829 Aug 2018

Researchers

Research units

  • RAS - Ioffe Physico Technical Institute
  • Lappeenranta University of Technology

Abstract

The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.

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