Measurement of dielectric properties at 75 - 325 GHz using a vector network analyzer and full-wave simulator.

Subash Khanal, Tero Kiuru, Juha Mallat, Olli Luukkonen, Antti V. Räisänen

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)551-556
JournalRadioengineering
Volume21
Issue number2
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed

Keywords

  • dielectric constant
  • loss tangent
  • material measurement.
  • permittivity
  • S-parameters

Cite this