Measurement of dielectric constants of thin films deposited on the substrates with the open resonator

Sergey N. Dudorov, Dmitri V. Lioubtchenko, Antti V. Räisänen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)381-387
    JournalJournal of Communications Technology and Electronics
    Volume50
    Issue number12
    Publication statusPublished - 2005
    MoE publication typeA1 Journal article-refereed

    Keywords

    • dielectric property
    • measurements
    • open resonator
    • thin films

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