Measurement of copper in p-type silicon using charge-carrier lifetime methods

Marko Yli-Koski, Hele Savin, Eero Saarnilehto, Antti Haarahiltunen, Juha Sinkkonen, G. Berenyi, Tibor Pavelka

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)643-648
JournalSolid State Phenomena
Volume108-109
Issue number25
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

Keywords

  • copper
  • PCD
  • silicon
  • SPV

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