Measurement of a System-Adaptive Error-Detection Sequential Circuit with Subthreshold SCL

Matthew Turnquist, Erkka Laulainen, Jani Mäkipää, Lauri Koskinen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationIEEE NORCHIP Conference, Lund, Sweden, November 14-15, 2011
    Publication statusPublished - 2011
    MoE publication typeA4 Article in a conference publication

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