Measurement of a System-Adaptive Error-Detection Sequential Circuit with Subthreshold SCL

Matthew Turnquist, Erkka Laulainen, Jani Mäkipää, Lauri Koskinen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	IEEE NORCHIP Conference, Lund, Sweden, November 14-15, 2011
Publication status	Published - 2011
MoE publication type	A4 Conference publication

OpenUrl availability

@inproceedings{d218a9d5c07f4ba180fbf6dc9b3e74af,

title = "Measurement of a System-Adaptive Error-Detection Sequential Circuit with Subthreshold SCL",

author = "Matthew Turnquist and Erkka Laulainen and Jani M{\"a}kip{\"a}{\"a} and Lauri Koskinen",

year = "2011",

language = "English",

booktitle = "IEEE NORCHIP Conference, Lund, Sweden, November 14-15, 2011",

}