Manipulation of nanometer size aerosol particles with atomic force microscope (AFM)

M. Martin, L. Roschier, B. Schleicher, P. Hakonen, Ü. Parts, E. Kauppinen, M. Paalanen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationXXXII Annual Conference of the Finnish Physical Society, Tampere, Finland, 19.-21.3.1998
    Place of PublicationTampere
    PublisherThe Finnish Physical Society, Tampere University of Technology
    Pages11
    Publication statusPublished - 1998
    MoE publication typeA4 Article in a conference publication

    Keywords

    • aerosol particles
    • nanometer

    Cite this