Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy

M. Martin*, L. Roschier, P. Hakonen, Ü. Parts, M. Paalanen, B. Schleicher, E. I. Kauppinen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

56 Citations (Scopus)
9 Downloads (Pure)

Abstract

We have developed a scheme to manipulate metallic aerosol particles on silicon dioxide substrates using an atomic force microscope. The method utilizes the noncontact mode both for locating and moving nanoparticles of size 10-100 nm. The main advantage of our technique is the possibility of "seeing" the moving particle in real time. Our method avoids well sticking problems that typically hamper the manipulation in the contact mode.

Original languageEnglish
Pages (from-to)1505-1507
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number11
DOIs
Publication statusPublished - 1998
MoE publication typeA1 Journal article-refereed

Keywords

  • Ag nanoparticles

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