Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy

M. Martin; L. Roschier; P. Hakonen; Ü. Parts; M. Paalanen; B. Schleicher; E. I. Kauppinen

doi:10.1063/1.122187

Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy

M. Martin^*, L. Roschier, P. Hakonen, Ü. Parts, M. Paalanen, B. Schleicher, E. I. Kauppinen

^*Corresponding author for this work

Department of Applied Physics

VTT Technical Research Centre of Finland

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Abstract

We have developed a scheme to manipulate metallic aerosol particles on silicon dioxide substrates using an atomic force microscope. The method utilizes the noncontact mode both for locating and moving nanoparticles of size 10-100 nm. The main advantage of our technique is the possibility of "seeing" the moving particle in real time. Our method avoids well sticking problems that typically hamper the manipulation in the contact mode.

Original language	English
Pages (from-to)	1505-1507
Number of pages	3
Journal	Applied Physics Letters
Volume	73
Issue number	11
DOIs	https://doi.org/10.1063/1.122187
Publication status	Published - 1998
MoE publication type	A1 Journal article-refereed

Keywords

Ag nanoparticles

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AU - Schleicher, B.

AU - Kauppinen, E. I.

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Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy

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