Low temperature irration tests of the CERN-LHC protection diodes at the VTT-Triga nuclear reactor in Otaniemi, A cryogenic feasibility study

H. Collan; S. Salmenhaara

Low temperature irration tests of the CERN-LHC protection diodes at the VTT-Triga nuclear reactor in Otaniemi, A cryogenic feasibility study

H. Collan, S. Salmenhaara

Research output: Working paper › Professional

Original language	English
Place of Publication	Espoo
Pages	38
Publication status	Published - 1993
MoE publication type	D4 Published development or research report or study

Publication series

Name	Optoelectronics Laboratory, Helsinki University of Technology
No.	TKK-F-C153

Keywords

radiation damage
semiconductor diodes

Cite this

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title = "Low temperature irration tests of the CERN-LHC protection diodes at the VTT-Triga nuclear reactor in Otaniemi, A cryogenic feasibility study",

keywords = "radiation damage, semiconductor diodes, radiation damage, semiconductor diodes, radiation damage, semiconductor diodes",

author = "H. Collan and S. Salmenhaara",

year = "1993",

language = "English",

series = "Optoelectronics Laboratory, Helsinki University of Technology",

number = "TKK-F-C153",

pages = "38",

type = "WorkingPaper",

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TY - UNPB

T1 - Low temperature irration tests of the CERN-LHC protection diodes at the VTT-Triga nuclear reactor in Otaniemi, A cryogenic feasibility study

AU - Collan, H.

AU - Salmenhaara, S.

PY - 1993

Y1 - 1993

KW - radiation damage

KW - semiconductor diodes

KW - radiation damage

KW - semiconductor diodes

KW - radiation damage

KW - semiconductor diodes

M3 - Working paper

T3 - Optoelectronics Laboratory, Helsinki University of Technology

SP - 38

BT - Low temperature irration tests of the CERN-LHC protection diodes at the VTT-Triga nuclear reactor in Otaniemi, A cryogenic feasibility study

CY - Espoo

ER -