Low energy electron beam induced damage on InGaN/GaN quantum well structure

Henri Nykänen, Päivi Mattila, Sami Suihkonen, Juha Riikonen, Emilie Quillet, Estelle Homeyer, Joel Bellessa, Markku Sopanen

Research output: Contribution to journalArticleScientificpeer-review

23 Citations (Scopus)
Original languageEnglish
Article number083105
JournalJournal of Applied Physics
Volume109
Issue number8
DOIs
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

Cite this