Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers

Ivan Radevici*, Jonna Tiira, Jani Oksanen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

5 Citations (Scopus)
9 Downloads (Pure)

Abstract

Developing optical cooling technologies requires access to reliable efficiency measurement techniques and ability to detect spatial variations in the efficiency and light emission of the devices. We investigate the possibility to combine the calorimetric efficiency measurement principles with lock-in thermography (LIT) and conventional luminescence microscopy to enable spatially resolved measurement of the efficiency, current spreading and local device heating of double diode structures (DDS) serving as test vessels for developing thermophotonic cooling devices. Our approach enables spatially resolved characterization and localization of the losses of the double diode structures as well as other light emitting semiconductor devices. In particular, the approach may allow directly observing effects like current crowding and surface recombination on the light emission and heating of the DDS devices.

Original languageEnglish
Title of host publicationOptical and Electronic Cooling of Solids II
Editors Richard I. Epstein, Denis V. Seletskiy, Mansoor Sheik-Bahae
Pages1-7
Number of pages7
ISBN (Electronic)9781510606838
DOIs
Publication statusPublished - 2017
MoE publication typeA4 Article in a conference publication
EventOptical and Electronic Cooling of Solids - San Francisco, United States
Duration: 1 Feb 20172 Feb 2017
Conference number: 2

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume10121
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical and Electronic Cooling of Solids
CountryUnited States
CitySan Francisco
Period01/02/201702/02/2017

Keywords

  • double diode structures
  • efficiency nonuniformity
  • electroluminescent cooling
  • III-V semiconductors
  • lock-in thermography
  • quantum efficiency
  • radiative and non-radiative recombination
  • surface states

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