Light activated copper defects in p-type silicon studied by PCD

Marko Yli-Koski, Hele Väinölä, Antti Haarahiltunen, Jan Storgårds, Eero Saarnilehto, Juha Sinkkonen

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)69-72
JournalPhysica Scripta
Issue numberT114
Publication statusPublished - 2004
MoE publication typeA1 Journal article-refereed

Keywords

  • carrier lifetime
  • copper
  • corona charge
  • optical activation
  • photoconductive decay
  • precipitation
  • silicon

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