@article{466f0910d71a42fa8591df6dfaab8503,
title = "Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples",
keywords = "atomic force microscopy, force modulation, lateral force microscopy, PbS, SILAR, thin films, atomic force microscopy, force modulation, lateral force microscopy, PbS, SILAR, thin films, atomic force microscopy, force modulation, lateral force microscopy, PbS, SILAR, thin films",
author = "R. Resch and G. Friedbacher and M. Grasserbauer and T. Kanniainen and S. Lindroos and M. Leskel{\"a} and L. Niinist{\"o}",
year = "1997",
language = "English",
volume = "120",
pages = "51--57",
journal = "Applied Surface Science",
issn = "1873-5584",
publisher = "Elsevier",
}