Large-Signal MESFET Model Including Trapping Effects

Tapani Närhi, M. Valtonen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication23rd European Microwave Conference '93, Madrid, Spain, 1993
    Place of PublicationMadrid, Spain
    Pages525-527
    Publication statusPublished - 1993
    MoE publication typeA4 Article in a conference publication

    Keywords

    • APLAC
    • CAD
    • CAE
    • MESFET
    • modeling

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