Josephson penetration depth in coplanar junctions based on 2D materials

Tianyi Li*, John C. Gallop, Ling Hao, Edward J. Romans

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

Abstract

Josephson junctions and superconducting quantum interference devices with graphene or other 2D materials as the weak link between superconductors have become a hot topic of research in recent years, with respect to both fundamental physics and potential applications. We have previously reported ultrawide Josephson junctions (up to 80 μm wide) based on chemical-vapor-deposition graphene where the critical current was found to be uniformly distributed in the direction perpendicular to the current. In this paper, we demonstrate that the unusually large Josephson penetration depth λ J that this corresponds to is enabled by the unique geometric structure of Josephson junctions based on 2D materials. We derive a new expression for the Josephson penetration depth of such junctions and verify our assumptions by numerical simulations.

Original languageEnglish
Article number173901
Pages (from-to)1-7
JournalJournal of Applied Physics
Volume126
Issue number17
DOIs
Publication statusPublished - 7 Nov 2019
MoE publication typeA1 Journal article-refereed

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