Ion beam analysis of impurities in SrS:Ce thin films grown by ALE

Wei-Min Li, Mikko Ritala, Markku Leskelä, Reijo Lappalainen, Janne Jokinen, Erkki Soininen, Erja Nykänen, Lauri Niinistö

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationTartto
    Pages36
    Publication statusPublished - 1997
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameThe 4th Baltic Symposium on Atomic Layer Epitaxy, Tartto, Viro, 10.-11.10.1997

    Keywords

    • analysis
    • atomic layer epitaxy
    • impurity
    • strontium sulfide
    • thin film

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