(invited talk) Quantitative copper and iron measurement in silicon using contactless recombination lifetime measurements

Hele Savin

(invited talk) Quantitative copper and iron measurement in silicon using contactless recombination lifetime measurements

Hele Savin

Research output: Contribution to conference › Abstract › Scientific › peer-review

Original language	English
Publication status	Published - 2005
MoE publication type	Not Eligible
Event	RD50 - Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders - Helsinki, Finland Duration: 2 Jun 2005 → 4 Jun 2005 Conference number: 6

Workshop

Workshop	RD50 - Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders
Abbreviated title	CERN RD50
Country/Territory	Finland
City	Helsinki
Period	02/06/2005 → 04/06/2005

Cite this

@conference{854aee7a13ea42cb88f775f7f291aff2,

title = "(invited talk) Quantitative copper and iron measurement in silicon using contactless recombination lifetime measurements",

author = "Hele Savin",

year = "2005",

language = "English",

note = "RD50 - Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders, CERN RD50 ; Conference date: 02-06-2005 Through 04-06-2005",

}