Investigation of Semiconductor Laser Filamentation Using Near-Field Optical Microscopy

T. Setälä, P. Ryytty, K. Lindfors, M. Kaivola, C. Aminoff, P. Savolainen, S. Orsila, M. Pessa

    Research output: Working paperProfessional

    Original languageEnglish
    Pages4
    Publication statusPublished - 1998
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameXXXII Annual Conference of the Finnish Physical Society, Tampere, Finland, March 19-21

    Keywords

    • laser beam filamentation
    • near-field optical microscopy

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