Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

Peter V. Sushko, Adam S. Foster, Lev N. Kantorovich, Alexander L. Shluger*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

23 Citations (Scopus)

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Engineering & Materials Science

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Chemical Compounds