Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

Peter V. Sushko, Adam S. Foster, Lev N. Kantorovich, Alexander L. Shluger*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

23 Citations (Scopus)

Abstract

We have studied the possible modifications to a noncontact scanning force microscopy (SFM) silicon tip due to adsorption of species from the gas phase and due to contact with a NaCl surface. A model of the tip was developed based on a 33 atom silicon cluster, and then the different adsorbates were added and changes to tip electrostatic properties investigated. The interaction of a silicon tip with a NaCl surface was modelled quantum mechanically, allowing us to calculate the charge state of the adsorbed chlorine ion in the process of separation of the two surfaces.

Original languageEnglish
Pages (from-to)608-612
Number of pages5
JournalApplied Surface Science
Volume144-145
DOIs
Publication statusPublished - Apr 1999
MoE publication typeA1 Journal article-refereed

Keywords

  • NaCl surface
  • Noncontact SFM
  • Silicon tip contamination

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