International Comparison of Eight Semiconductor Lasers Stabilized on 127I2 at 633 nm

A. Zarka, Ahmed Abou-Zeid, J.-M. Cahrtier, J.-F. Cliche, O. Cip, C. Edwards, F. Imkenberg, P. Jedlicka, B. Kabel, A. Lassila, J. Lazar, Y. Milleroiux, M. Merimaa, H. Simonsen, M. Tetu, J.-P. Wallerand

Research output: Contribution to journalArticleScientificpeer-review

23 Citations (Scopus)
Original languageEnglish
Pages (from-to)329-339
JournalMetrologia
Volume37
Issue number37
Publication statusPublished - 2000
MoE publication typeA1 Journal article-refereed

Keywords

  • international comparison
  • semiconductor laser

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