Interferometric Length Measurements

E. Ikonen, A. Lassila, J. Luukkainen, K. Riski

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationInternational Symposium on Optical Applied Science and Engineering, San Diego, U.S.A., 1992
Publication statusPublished - 1992
MoE publication typeA4 Article in a conference publication


  • gauge blocks
  • interferometry
  • line scales

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