Interferometric imaging of reflective micro-objects in the presence of strong aberrations
Research output: Contribution to journal › Article › Scientific › peer-review
- University College Cork
- University of Eastern Finland
Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object’s intensity image.
|Number of pages||10|
|Publication status||Published - 1 Jan 2020|
|MoE publication type||A1 Journal article-refereed|