Interferometric imaging of reflective micro-objects in the presence of strong aberrations

Elena Ilina; Markus Nyman; Tanmay Mondal; Matti Kaivola; Tero Setälä; Andriy Shevchenko

doi:10.1364/OE.383451

Interferometric imaging of reflective micro-objects in the presence of strong aberrations

Elena Ilina^*, Markus Nyman, Tanmay Mondal, Matti Kaivola, Tero Setälä, Andriy Shevchenko

^*Corresponding author for this work

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Abstract

Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object’s intensity image.

Original language	English
Pages (from-to)	1817-1826
Number of pages	10
Journal	Optics Express
Volume	28
Issue number	2
DOIs	https://doi.org/10.1364/OE.383451
Publication status	Published - 1 Jan 2020
MoE publication type	A1 Journal article-refereed

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Ilina__Interferometric.oe-28-2-1817-3Final published version, 615 KBLicence: CC BY

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Photonics Research and Innovation
Kaivola, M.
01/01/2019 → 31/12/2022
Project: Academy of Finland: Other research funding
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Mäkelä, K.
01/01/2019 → 31/12/2022
Project: Academy of Finland: Other research funding

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Cite this

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title = "Interferometric imaging of reflective micro-objects in the presence of strong aberrations",

abstract = "Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object{\textquoteright}s intensity image.",

author = "Elena Ilina and Markus Nyman and Tanmay Mondal and Matti Kaivola and Tero Set{\"a}l{\"a} and Andriy Shevchenko",

year = "2020",

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doi = "10.1364/OE.383451",

language = "English",

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AU - Ilina, Elena

AU - Nyman, Markus

AU - Mondal, Tanmay

AU - Kaivola, Matti

AU - Setälä, Tero

AU - Shevchenko, Andriy

PY - 2020/1/1

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N2 - Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object’s intensity image.

AB - Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object’s intensity image.

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JO - Optics Express

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SN - 1094-4087

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Interferometric imaging of reflective micro-objects in the presence of strong aberrations

Abstract

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Photonics Research and Innovation

PREIN: Photonics Research and Innovation

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