Interferometric imaging of reflective micro-objects in the presence of strong aberrations

Elena Ilina*, Markus Nyman, Tanmay Mondal, Matti Kaivola, Tero Setälä, Andriy Shevchenko

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
55 Downloads (Pure)

Abstract

Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object’s intensity image.

Original languageEnglish
Pages (from-to)1817-1826
Number of pages10
JournalOptics Express
Volume28
Issue number2
DOIs
Publication statusPublished - 1 Jan 2020
MoE publication typeA1 Journal article-refereed

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