Interfacial resistive anomaly at a normal-superconducting boundary

Y. K. Kwong*, K. Lin, P. J. Hakonen, M. S. Isaacson, J. M. Parpia

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

44 Citations (Scopus)

Abstract

We have observed an anomalous peak (∼5% of the normal-state resistance) in the resistive transition of a thin-film aluminum system consisting of regions of different, but comparable, transition temperatures. The peak occurs at slightly above the transition temperature of the lower Tc section. The magnitude decreases with the distance of the voltage probes from the normal-superconducting (N-S) interface with a characteristic length scale of a few μm and is sensitive to a magnetic field. This anomaly appears to be consistent with a nearly constant superconducting potential near a N-S interface.

Original languageEnglish
Pages (from-to)462-465
Number of pages4
JournalPhysical Review B
Volume44
Issue number1
DOIs
Publication statusPublished - 1991
MoE publication typeA1 Journal article-refereed

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