Interaction of deuterium with lattice defects in nickel

F. Besenbacher*, H. Bogh, A. A. Pisarev, M. J. Puska, S. Holloway, J. K. Nørskov

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

27 Citations (Scopus)

Abstract

The trapping of ion-implanted deuterium (D) in fee Ni is investigated by ion-beam-analysis techniques. Two lattice-defect traps have been observed with trap-binding enthalpies 0.24 eV and 0.43 eV referred to an untrapped solution site. The lattice location of D when associated with the defect traps is obtained by the channeling technique following anneals at various temperatures. The detailed analysis of these channeling data is based on a comparison with multirow continuum-model calculations of the angular yields for different D positions. These channeling calculations are extended by introducing a parameter δψ which encompasses the spreading in transverse energy caused by effects such as, for example, electron and nuclear multiple scattering. Also new and improved theoretical calculations based on the effective medium scheme of the equilibrium positions of H isotopes at defects, especially vacancies, are presented. The calculations show that D is delocalized over the entire vacancy, with a maximum density in the region between the vacancy and the nearest octahedral site. This picture is supported by the finding that the channeling data for D trapped to vacancies cannot be interpreted in terms of a single lattice site, and preference in site occupancy is found for D displaced from the vacancy towards the octahedral and (smaller) tetrahedral sites, respectively.

Original languageEnglish
Pages (from-to)374-387
Number of pages14
JournalNUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume4
Issue number3
DOIs
Publication statusPublished - Aug 1984
MoE publication typeA1 Journal article-refereed

Fingerprint Dive into the research topics of 'Interaction of deuterium with lattice defects in nickel'. Together they form a unique fingerprint.

  • Cite this