Integrated use of spectroscopic techniques for the characterization of thin film electroluminescent structures

L. Niinistö, M. Leskelä

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)133-147
    JournalACTA CHIMICA SLOVENICA
    Volume40
    Issue number2
    Publication statusPublished - 1993
    MoE publication typeA1 Journal article-refereed

    Keywords

    • AAS
    • AES
    • EXAFS
    • FTIR
    • secondary ion mass spectroscopy (SIMS)
    • thin films
    • XPS
    • XRF

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