Insulation defect localization through partial discharge measurements and numerical classification

Sanna Pöyhönen, Marco Conti, Andrea Cavallini, Gian C. Montanari, Fiorenzo Filippetti

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    10 Citations (Scopus)
    Original languageEnglish
    Title of host publication2004 IEEE International Symposium on Industrial Electronics - ISIE 2004, Ajaccio, France, 4 - 7 May, 2004
    Place of PublicationAjaccio, France
    PublisherIEEE
    Pages417-422
    ISBN (Electronic)0-7803-8305-2
    ISBN (Print)0-7803-8304-4
    Publication statusPublished - 2004
    MoE publication typeA4 Conference publication

    Keywords

    • defect localization
    • insulation systems
    • partial discharges
    • support vector machine

    Cite this