In situ reflectance monitoring of thick GaAsN layers

Outi Reentilä, Aapo Lankinen, Antti Säynätjoki, Marco Mattila, Turkka Tuomi, Harri Lipsanen, Lisa "O'Reilly", P.J. McNally

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationThe 6th International Conference on Materials for Microelectronics & Nanoengineering MFMN, 27-29.10.2006, Cranfield, UK
    Publication statusPublished - 2006
    MoE publication typeA4 Article in a conference publication

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