In-situ investigations on the SILAR-growth of ZnS films as studied by tapping mode atomic force microscopy

R. Resch, G. Friedbacher, M. Grasserbauer, T. Kanniainen, S. Lindroos, M. Leskelä, L. Niinistö

    Research output: Contribution to journalArticleScientificpeer-review

    12 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)80-84
    JournalFresenius' Journal of Analytical Chemistry
    Volume358
    Publication statusPublished - 1997
    MoE publication typeA1 Journal article-refereed

    Keywords

    • in-situ imaging
    • SILAR-growth
    • tapping mode AFM
    • zinc sulfide

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