@article{d5686fafa4104648b4b94fe35f3415ec,
title = "In-situ investigation of ZnS deposition on mica by successive ionic layer adsorption and reaction method as studied with atomic force microscopy",
keywords = "afm, atomic force microscopy, silar, thin film, zns, afm, atomic force microscopy, silar, thin film, zns, afm, atomic force microscopy, silar, thin film, zns",
author = "R. Resch and T. Prohaska and G. Friedbacher and M. Grasserbauer and T. Kanniainen and S. Lindroos and M. Leskel{\"a} and L. Niinist{\"o} and J.A Broekaert",
year = "1995",
language = "English",
volume = "353",
pages = "772--777",
journal = "Fresenius' Journal of Analytical Chemistry",
publisher = "Springer",
}