Abstract
TlBr is a promising material for gamma-ray detectors; however, it has crystal quality problems originated from the crystal growth itself and further treatments during detector fabrication. The effect of technological improvements on crystal quality has been studied in this work. Low performance of studied detectors was shown to be associated with residual stress or/and small-angle grain boundaries in these crystals. Several crystals failed as detectors were proved to contain impurities.
Original language | English |
---|---|
Pages (from-to) | 126-128 |
Number of pages | 3 |
Journal | NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT |
Volume | 607 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1 Aug 2009 |
MoE publication type | A1 Journal article-refereed |
Keywords
- Growth from melts
- Thallium bromide
- X- and gamma-ray solid-state detectors