Improved rotational invariance for statistical inverse in electrical impedance tomography.

Jani Lahtinen; Tomas Martinsen; Jouko Lampinen

doi:10.1109/IJCNN.2000.857890

Improved rotational invariance for statistical inverse in electrical impedance tomography.

Jani Lahtinen
, Tomas Martinsen
, Jouko Lampinen

Department of Neuroscience and Biomedical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS
Editors	S.-I. Amari, C. Giles, M. Gori, V. Piuri
Publisher	IEEE
Pages	154-158
Number of pages	5
Volume	2
ISBN (Print)	0-7695-0619-4
DOIs	https://doi.org/10.1109/IJCNN.2000.857890
Publication status	Published - 2000
MoE publication type	A4 Conference publication
Event	International Joint Conference on Neural Networks - Como, Italy Duration: 24 Jul 2000 → 27 Jul 2000

Publication series

Name	IEEE International Joint Conference on Neural Networks (IJCNN)
ISSN (Print)	1098-7576

Conference

Conference	International Joint Conference on Neural Networks
Abbreviated title	IJCNN
Country/Territory	Italy
City	Como
Period	24/07/2000 → 27/07/2000

Keywords

electrical impedance tomography
inverse methods
neural networks
rotational invariance

Access to Document

10.1109/IJCNN.2000.857890

Cite this

Lahtinen, J., Martinsen, T., & Lampinen, J. (2000). Improved rotational invariance for statistical inverse in electrical impedance tomography. In S.-I. Amari, C. Giles, M. Gori, & V. Piuri (Eds.), IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS (Vol. 2, pp. 154-158). (IEEE International Joint Conference on Neural Networks (IJCNN)). IEEE. https://doi.org/10.1109/IJCNN.2000.857890

Lahtinen, Jani ; Martinsen, Tomas ; Lampinen, Jouko. / Improved rotational invariance for statistical inverse in electrical impedance tomography. IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS. editor / S.-I. Amari ; C. Giles ; M. Gori ; V. Piuri. Vol. 2 IEEE, 2000. pp. 154-158 (IEEE International Joint Conference on Neural Networks (IJCNN)).

@inproceedings{2b009926a8ed49ad92c808e91f15e322,

title = "Improved rotational invariance for statistical inverse in electrical impedance tomography.",

keywords = "electrical impedance tomography, inverse methods, neural networks, rotational invariance, electrical impedance tomography, inverse methods, neural networks, rotational invariance, electrical impedance tomography, inverse methods, neural networks, rotational invariance",

author = "Jani Lahtinen and Tomas Martinsen and Jouko Lampinen",

year = "2000",

doi = "10.1109/IJCNN.2000.857890",

language = "English",

isbn = "0-7695-0619-4 ",

volume = "2",

series = "IEEE International Joint Conference on Neural Networks (IJCNN)",

publisher = "IEEE",

pages = "154--158",

editor = "S.-I. Amari and C. Giles and M. Gori and V. Piuri",

booktitle = "IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS",

address = "United States",

note = "International Joint Conference on Neural Networks, IJCNN ; Conference date: 24-07-2000 Through 27-07-2000",

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Lahtinen, J, Martinsen, T & Lampinen, J 2000, Improved rotational invariance for statistical inverse in electrical impedance tomography. in S-I Amari, C Giles, M Gori & V Piuri (eds), IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS. vol. 2, IEEE International Joint Conference on Neural Networks (IJCNN), IEEE, pp. 154-158, International Joint Conference on Neural Networks, Como, Italy, 24/07/2000. https://doi.org/10.1109/IJCNN.2000.857890

Improved rotational invariance for statistical inverse in electrical impedance tomography. / Lahtinen, Jani; Martinsen, Tomas; Lampinen, Jouko.
IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS. ed. / S.-I. Amari; C. Giles; M. Gori; V. Piuri. Vol. 2 IEEE, 2000. p. 154-158 (IEEE International Joint Conference on Neural Networks (IJCNN)).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Improved rotational invariance for statistical inverse in electrical impedance tomography.

AU - Lahtinen, Jani

AU - Martinsen, Tomas

AU - Lampinen, Jouko

PY - 2000

Y1 - 2000

KW - electrical impedance tomography

KW - inverse methods

KW - neural networks

KW - rotational invariance

KW - electrical impedance tomography

KW - inverse methods

KW - neural networks

KW - rotational invariance

KW - electrical impedance tomography

KW - inverse methods

KW - neural networks

KW - rotational invariance

U2 - 10.1109/IJCNN.2000.857890

DO - 10.1109/IJCNN.2000.857890

M3 - Conference article in proceedings

SN - 0-7695-0619-4

VL - 2

T3 - IEEE International Joint Conference on Neural Networks (IJCNN)

SP - 154

EP - 158

BT - IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS

A2 - Amari, S.-I.

A2 - Giles, C.

A2 - Gori, M.

A2 - Piuri, V.

PB - IEEE

T2 - International Joint Conference on Neural Networks

Y2 - 24 July 2000 through 27 July 2000

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Lahtinen J, Martinsen T, Lampinen J. Improved rotational invariance for statistical inverse in electrical impedance tomography. In Amari SI, Giles C, Gori M, Piuri V, editors, IJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS. Vol. 2. IEEE. 2000. p. 154-158. (IEEE International Joint Conference on Neural Networks (IJCNN)). doi: 10.1109/IJCNN.2000.857890