Improved rotational invariance for statistical inverse in electrical impedance tomography.

Jani Lahtinen, Tomas Martinsen, Jouko Lampinen

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationIJCNN 2000: PROCEEDINGS OF THE IEEE-INNS-ENNS INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS
EditorsS.-I. Amari, C. Giles, M. Gori, V. Piuri
PublisherIEEE Computer Society
Pages154-158
Number of pages5
Volume2
ISBN (Print)0-7695-0619-4
DOIs
Publication statusPublished - 2000
MoE publication typeA4 Article in a conference publication
EventInternational Joint Conference on Neural Networks - Como, Italy
Duration: 24 Jul 200027 Jul 2000

Publication series

NameIEEE International Joint Conference on Neural Networks (IJCNN)
ISSN (Print)1098-7576

Conference

ConferenceInternational Joint Conference on Neural Networks
Abbreviated titleIJCNN
CountryItaly
CityComo
Period24/07/200027/07/2000

Keywords

  • electrical impedance tomography
  • inverse methods
  • neural networks
  • rotational invariance

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