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Improved RF Transistor Modelling by Statistical and Singularity Analysis

  • V. Porra
  • , J. Vidkjaer
  • , J.Zheng Zhu
  • , Timo Huttunen

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationEspoo, Finland
    Pages20-21
    Publication statusPublished - 1995
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameThe IRC Worshop'95, Espoo, Finland, May 1995

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