Improved Methods for Development of High Reliability Electronics

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Standard

Improved Methods for Development of High Reliability Electronics. / Li, Jue; Dong, Hongqun; Vuorinen, Vesa; Karppinen, Juha; Mattila, Toni T.; Paulasto-Kröckel, Mervi.

2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.. United States : IEEE, 2014.

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Harvard

Li, J, Dong, H, Vuorinen, V, Karppinen, J, Mattila, TT & Paulasto-Kröckel, M 2014, Improved Methods for Development of High Reliability Electronics. in 2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.. IEEE, United States.

APA

Li, J., Dong, H., Vuorinen, V., Karppinen, J., Mattila, T. T., & Paulasto-Kröckel, M. (2014). Improved Methods for Development of High Reliability Electronics. In 2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana. United States: IEEE.

Vancouver

Li J, Dong H, Vuorinen V, Karppinen J, Mattila TT, Paulasto-Kröckel M. Improved Methods for Development of High Reliability Electronics. In 2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.. United States: IEEE. 2014

Author

Li, Jue ; Dong, Hongqun ; Vuorinen, Vesa ; Karppinen, Juha ; Mattila, Toni T. ; Paulasto-Kröckel, Mervi. / Improved Methods for Development of High Reliability Electronics. 2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.. United States : IEEE, 2014.

Bibtex - Download

@inproceedings{5182007bc29d4fe0afbb79887da18f52,
title = "Improved Methods for Development of High Reliability Electronics",
author = "Jue Li and Hongqun Dong and Vesa Vuorinen and Juha Karppinen and Mattila, {Toni T.} and Mervi Paulasto-Kr{\"o}ckel",
year = "2014",
language = "English",
booktitle = "2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.",
publisher = "IEEE",

}

RIS - Download

TY - GEN

T1 - Improved Methods for Development of High Reliability Electronics

AU - Li, Jue

AU - Dong, Hongqun

AU - Vuorinen, Vesa

AU - Karppinen, Juha

AU - Mattila, Toni T.

AU - Paulasto-Kröckel, Mervi

PY - 2014

Y1 - 2014

UR - http://www.aeroconf.org/

M3 - Conference contribution

BT - 2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.

PB - IEEE

CY - United States

ER -

ID: 636425