Impedance imaging and Markov chain Monte Carlo methods

E Somersalo*, J Kaipio, M Vauhkonen, D Baroudi, S Jarvenpaa

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

9 Citations (Scopus)

Abstract

The article discusses the electrical impedance imaging problem (EIT) from a Bayesian point of view. We discuss two essentially different EIT problems: The first one is the static problem of estimating the resistivity distribution of a body from the static current/voltage measurements on the surface of the body. The other problem is a gas temperature distribution retrieval problem by resistivity measurements of metal filaments placed in the gas funnel. In these examples, the prior information contains inequality constraints and non-smooth functionals. Consequently, gradient-based maximum likelihood search algorithms converge poorly. To overcome this difficulty, we study the possibility of using a Markov chain Monte Carlo algorithm to explore the posterior distribution.

Original languageEnglish
Title of host publicationCOMPUTATIONAL, EXPERIMENTAL, AND NUMERICAL METHODS FOR SOLVING ILL-POSED INVERSE IMAGING PROBLEMS: MEDICAL AND NONMEDICAL APPLICATIONS
EditorsRL Barbour, MJ Carvlin, MA Fiddy
PublisherSPIE
Pages175-185
Number of pages11
ISBN (Print)0-8194-2593-1
Publication statusPublished - 1997
MoE publication typeA4 Conference publication
EventConference on Computational, Experimental, and Numerical Methods for Solving Ill-Posed Inverse Imaging Problems: Medical and Nonmedical Applications - San Diego, United States
Duration: 30 Jul 199731 Jul 1997

Publication series

NamePROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Volume3171
ISSN (Print)0277-786X

Conference

ConferenceConference on Computational, Experimental, and Numerical Methods for Solving Ill-Posed Inverse Imaging Problems: Medical and Nonmedical Applications
Country/TerritoryUnited States
CitySan Diego
Period30/07/199731/07/1997

Keywords

  • electrical impedance tomography
  • Bayesian methods
  • inverse problems
  • MCMC
  • temperature tomography

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