@article{d1c57bb11a7140779be811c4f2036c43,
title = "Impact of strain on the passivation efficiency of Ge dangling bond interface defects in condensation grown SiO2/Si1-xGex/SiO2/(100)Si structures with nm-thi",
keywords = "charge, defect, positron, charge, defect, positron, charge, defect, positron",
author = "O. Madia and A.P.D. Nguyen and N.H. Thoan and V. {"}Afanas'ev{"} and A. Stesmans and L. Souriau and J. Slotte and F. Tuomisto",
note = "| openaire: EC/FP7/261868/EU//MORDRED",
year = "2014",
month = feb,
day = "1",
doi = "10.1016/j.apsusc.2013.09.025",
language = "English",
volume = "291",
pages = "11--15",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
}