Identification of the native vacancy defects in ZnSxSe1-x and MgyZn1-ySxSe1-x by positron annihilation

  • K. Saarinen
  • , T. Laine
  • , K. Skog
  • , J. Oila
  • , P. Hautojärvi
  • , K. Rakennus
  • , P. Uusimaa
  • , A. Salokatve
  • , M. Pessa

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationFall meeting of the Materials Research Society, Boston, USA 1.-5.12.1997
Pages567
Publication statusPublished - 1997
MoE publication typeA4 Conference publication

Keywords

  • compound semiconductors
  • defects

Cite this