Hole density and acceptor-type defects in MBE-grown GaSb1-x Bix

N. Segercrantz*, J. Slotte, I. Makkonen, F. Tuomisto, I. C. Sandall, M.J. Ashwin, T.D. Veal

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
155 Downloads (Pure)

Projects

Finished

Large-scale electronic structure techniques for advanced materials characterization

Makkonen, I., Simula, K. & Prozheeva, V.

01/09/201521/09/2018

Project: Academy of Finland: Other research funding

Large-scale electronic structure techniques for advanced materials characterization

Makkonen, I.

01/09/201522/09/2019

Project: Academy of Finland: Other research funding