High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

K. Lindfors*, M. Kapulainen, P. Ryytty, M. Kaivola

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

7 Citations (Scopus)

Abstract

An easy-to-implement non-optical shear-force detection setup for tip-sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.

Original languageEnglish
Pages (from-to)651-656
Number of pages6
JournalOptics and Laser Technology
Volume36
Issue number8
DOIs
Publication statusPublished - Nov 2004
MoE publication typeA1 Journal article-refereed

Keywords

  • Laser characterization
  • Non-optical shear-force detection
  • Scanning near-field optical microscopy

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