High-resolution setup for measuring wavelength sensitivity of photoyellowing of translucent materials

Anna Vaskuri, Petri Kärhä, Anu Heikkilä, Erkki Ikonen

Research output: Contribution to conferencePaperScientific

Abstract

(Poster presentation)
Original languageEnglish
Publication statusPublished - 2015
EventPTB Summer School on Metrology - Drübeck, Germany
Duration: 24 Aug 201528 Aug 2015

Course

CoursePTB Summer School on Metrology
CountryGermany
CityDrübeck
Period24/08/201528/08/2015

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    Vaskuri, A., Kärhä, P., Heikkilä, A., & Ikonen, E. (2015). High-resolution setup for measuring wavelength sensitivity of photoyellowing of translucent materials. Paper presented at PTB Summer School on Metrology, Drübeck, Germany.