We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times.
|Number of pages||4|
|Journal||PHYSICA E: LOW: DIMENSIONAL SYSTEMS AND NANOSTRUCTURES|
|Publication status||Published - Feb 2010|
|MoE publication type||A1 Journal article-refereed|
- Full counting statistics
- Quantum dot
- Single electron tunneling