High cumulants in the counting statistics measured for a quantum dot

Christian Fricke*, Frank Hohls, Christian Flindt, Rolf J. Haug

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

24 Citations (Scopus)

Abstract

We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times.

Original languageEnglish
Pages (from-to)848-851
Number of pages4
JournalPHYSICA E: LOW: DIMENSIONAL SYSTEMS AND NANOSTRUCTURES
Volume42
Issue number4
DOIs
Publication statusPublished - Feb 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • Cumulants
  • Full counting statistics
  • Quantum dot
  • Single electron tunneling

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