Harnessing Biased Faults in Attacks on ECC-based Signature Schemes

Kimmo Järvinen; Celine Blondeau; Dan Page; Michael Tunstall

doi:10.1109/FDTC.2012.13

Harnessing Biased Faults in Attacks on ECC-based Signature Schemes

Kimmo Järvinen, Celine Blondeau, Dan Page, Michael Tunstall

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

9 Citations (Scopus)

Original language	English
Title of host publication	FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012
Publisher	IEEE
Pages	72-82
ISBN (Print)	978-0-7695-4843-0
DOIs	https://doi.org/10.1109/FDTC.2012.13
Publication status	Published - 2012
MoE publication type	A4 Conference publication

Access to Document

10.1109/FDTC.2012.13

Cite this

@inproceedings{759d07426e3f4f5297c7b95b27353890,

title = "Harnessing Biased Faults in Attacks on ECC-based Signature Schemes",

author = "Kimmo J{\"a}rvinen and Celine Blondeau and Dan Page and Michael Tunstall",

note = "VK: crypto",

year = "2012",

doi = "10.1109/FDTC.2012.13",

language = "English",

isbn = "978-0-7695-4843-0",

pages = "72--82",

booktitle = "FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012",

publisher = "IEEE",

address = "United States",

}

Harnessing Biased Faults in Attacks on ECC-based Signature Schemes. / Järvinen, Kimmo; Blondeau, Celine; Page, Dan et al.
FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012. IEEE, 2012. p. 72-82.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Harnessing Biased Faults in Attacks on ECC-based Signature Schemes

AU - Järvinen, Kimmo

AU - Blondeau, Celine

AU - Page, Dan

AU - Tunstall, Michael

N1 - VK: crypto

PY - 2012

Y1 - 2012

UR - http://dx.doi.org/10.1109/FDTC.2012.13

UR - https://www.scopus.com/pages/publications/84867937093

U2 - 10.1109/FDTC.2012.13

DO - 10.1109/FDTC.2012.13

M3 - Conference article in proceedings

SN - 978-0-7695-4843-0

SP - 72

EP - 82

BT - FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012

PB - IEEE

ER -

Harnessing Biased Faults in Attacks on ECC-based Signature Schemes

Access to Document

Other files and links

Cite this